XP-160绝缘子直流快速积污过程仿真及分析Simulation Study on Fast DC Contamination Process of XP-160 Insulator and Its Analysis
张东东;张志劲;蒋兴良;张翼;乔新涵;倪喜军;
摘要(Abstract):
与交流线路相比,直流线路的污秽外绝缘问题更为严重。综合考虑了电场、流场及污秽颗粒积聚/出射的微观过程,开展了直流电场下的绝缘子表面快速积污过程仿真,继而仿真分析了不同风速、粒径下的绝缘子表面污秽分布现象、污秽质量密度及积污带电系数。同时开展了绝缘子风洞积污试验,与仿真结果进行对比,验证了文中所提的绝缘子快速直流积污仿真方法。最后结合快速积污过程仿真,提出了无降雨大气污秽下的绝缘子直流积污预测方法并进行了验证。研究结果表明,快速积污过程仿真较好地体现绝缘子的带电积污特性;仿真计算得到的绝缘子污秽质量密度与实测结果的相对误差在25%范围内,带电积污比与实测结果基本一致。研究结果可为揭示绝缘子直流积污机理提供参考,并为线路运行维护提供依据。
关键词(KeyWords): 绝缘子;直流;积污;有限元仿真;积污预测
基金项目(Foundation): 江苏省自然科学基金项目(BK20181021);; 南京工程学院高层次引进人才科研启动基金(YKJ201819);; 江苏省配电网智能技术与装备协同创新中心开放基金(XTCX201902)~~
作者(Author): 张东东;张志劲;蒋兴良;张翼;乔新涵;倪喜军;
Email:
DOI: 10.13335/j.1000-3673.pst.2019.0486
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