许渊;刘卫东;陈维江;李星;殷禹;毕建刚;崔博源;牛勃;

• 1:华北电力大学电气与电子工程学院
• 2:中国电力科学研究院有限公司
• 3:清华大学电机工程与应用电子技术系
• 4:国家电网有限公司

摘要(Abstract)：

近年来,GIS绝缘故障频发,为降低GIS故障率,保障供电安全,亟需解决GIS绝缘子沿面闪络诱因问题。根据以往研究,GIS绝缘子沿面闪络诱因主要怀疑是绝缘子表面微金属颗粒,但至今仍未发现运行工况下微金属颗粒诱发沿面闪络的放电机制和放电发展过程。为此建立了GIS绝缘子表面微金属颗粒运动和高灵敏脉冲电流局部放电观测实验平台,以5mm微金属颗粒为对象,实验发现运行工况下微金属颗粒运动诱发沿面闪络的现象,并观测到其局部放电发展过程,通过电场仿真、力学分析和实验研究了闪络机制,揭示了一种微金属颗粒诱发GIS绝缘子沿面闪络的诱因。

关键词(KeyWords)： 运行工况;GIS;绝缘子表面;微金属颗粒;运动;沿面闪络;局部放电

Abstract:

Keywords:

基金项目(Foundation): 国家电网公司科技项目(5442GY180033)~~

作者(Author): 许渊;刘卫东;陈维江;李星;殷禹;毕建刚;崔博源;牛勃;

Email:

DOI: 10.13335/j.1000-3673.pst.2019.1049

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